Taisei Kondo

Title: Taisei Kondo: Inventor in Semiconductor Testing

Introduction

Taisei Kondo is an inventor associated with Tokyo Electron Limited in Hokkaido, Japan. His patent work addresses automated positioning in probe-card testing, where accurate contact between a probe needle and a test object is important.

Latest Patents

Kondo is credited with 1 patent: “Testing Device and Method, and Non-Transitory Computer-Readable Recording Medium.” The invention describes a testing device that photographs a probe needle’s tip and uses a trained segmentation model to identify the needle and its tip in an image. It determines the tip’s position from the relationship between those regions, then adjusts the relative position of the test object and the needle. The approach is designed to support precise positioning during testing.

Career Highlights

Kondo’s listed invention focuses on applying image recognition and position adjustment to semiconductor testing equipment. His work is associated with Tokyo Electron Limited, a company that develops equipment for semiconductor manufacturing and testing.

Collaborations

The available information associates Kondo’s patent with Tokyo Electron Limited. It does not specify additional collaborators.

Conclusion

Taisei Kondo’s patent presents an image-based method for locating and positioning a probe needle, contributing to precision in semiconductor testing.