Average Co-Inventor Count = 3.4

ph-index = 12

Forward Citations = 449(Granted Patents)

Location History:

Katsuta, JP (1981 - 1994)
Hitachinaka, JP (1996 - 2012)

Company Filing History:

Hitachi-high-technologies Corporation

patents

1 out of 33

Hitachi-science Systems, Ltd.

patents

4. 1 out of 1,710

National Institute of Advanced Industrial Science and Technology

patents

5. 1 out of 832,680

Other

patents

where one patent can have more than one assignee

Years Active: 1981-2012

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40 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8134131 - Method and apparatus for observing inside structures, and specimen holder (2012-03-13),

2. 7928376 - Element mapping unit, scanning transmission electron microscope, and element mapping method (2011-04-19),

3. 7923701 - Charged particle beam equipment (2011-04-12),

4. 7476872 - Method and apparatus for observing inside structures, and specimen holder (2009-01-13),

5. 7462830 - Method and apparatus for observing inside structures, and specimen holder (2008-12-09),

6. 7375330 - Charged particle beam equipment (2008-05-20),

7. 7372047 - Charged particle system and a method for measuring image magnification (2008-05-13),

8. 7250601 - Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method (2007-07-31),

9. 7146872 - Micro manipulator (2006-12-12),

10. 7067805 - Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method (2006-06-27),

11. 6933501 - Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method (2005-08-23),

12. 6930306 - Electron microscope (2005-08-16),

13. 6855927 - Method and apparatus for observing element distribution (2005-02-15),

14. 6822233 - Method and apparatus for scanning transmission electron microscopy (2004-11-23),

15. 6794648 - Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method (2004-09-21),

As a client interested in inventor profiles, I would like to present you with an article about the esteemed inventor Shigeto Isakozawa.

**Title: The Innovative Mind of Shigeto Isakozawa**

Introduction:

Shigeto Isakozawa, a brilliant inventor hailing from Hitachinaka, Japan, has made significant contributions to the field of microscopy and analysis with an impressive portfolio of 40 patents under his name.

Latest Patents:

Among his recent patents is a groundbreaking 'Method and Apparatus for Observing Inside Structures and Specimen Holder.' This innovative invention allows for the tracking of aging degradation in samples, enabling the determination of failure mechanisms with precision and efficiency. Additionally, his 'Element Mapping Unit, Scanning Transmission Electron Microscope, and Element Mapping Method' revolutionize the acquisition of element mapping images, streamlining the process for enhanced accuracy and stability.

Career Highlights:

Shigeto Isakozawa has left his mark on esteemed companies such as Hitachi Co., Ltd and Hitachi High-Technologies Corporation, where his inventive spirit and dedication to advancement have flourished. His relentless pursuit of excellence has propelled him to the forefront of technological innovation.

Collaborations:

Throughout his illustrious career, Shigeto Isakozawa has collaborated with notable peers such as Kazutoshi Kaji and Takashi Aoyama, pooling their expertise to create cutting-edge solutions in the field of microscopy and analysis.

Conclusion:

In conclusion, Shigeto Isakozawa stands as a beacon of innovation in the realm of microscopy and analysis, consistently pushing the boundaries of what is possible with his inventive genius. His unwavering dedication to advancing technology has undoubtedly left a lasting impact on the industry.

Would you like to know more about other inventors or innovations?

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Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.