Company Filing History:
Years Active: 2005-2022
Title: The Innovative Contributions of Sharon McCauley
Introduction
Sharon McCauley is a prominent inventor based in San Jose, CA, known for her significant contributions to the field of semiconductor technology. With a total of 8 patents to her name, she has made remarkable advancements in methods and systems for inspecting wafers and reticles.
Latest Patents
One of her latest patents focuses on methods and systems for inspection of wafers and reticles using designer intent data. This innovative approach includes identifying nuisance defects on a wafer based on inspection data produced by inspecting a reticle, which is used to form a pattern on the wafer prior to its inspection. Another method involves detecting defects on a wafer by analyzing data generated from the inspection of the wafer in combination with data representative of a reticle. This data includes designations that identify different types of portions of the reticle. Additionally, she has developed methods to determine properties of manufacturing processes used to process a wafer based on defects that alter characteristics of devices formed on the wafer. Further advancements include altering or simulating characteristics of integrated circuit designs based on data generated from wafer inspections.
Career Highlights
Sharon McCauley is currently employed at KLA-Tencor Technologies Corporation, where she continues to push the boundaries of innovation in semiconductor inspection technologies. Her work has been instrumental in enhancing the efficiency and accuracy of wafer inspections, which are critical in the manufacturing of integrated circuits.
Collaborations
Throughout her career, Sharon has collaborated with notable colleagues, including David Winslow Randall and William Volk, contributing to a dynamic and innovative work environment.
Conclusion
Sharon McCauley's contributions to the field of semiconductor technology through her patents and work at KLA-Tencor Technologies Corporation highlight her role as a leading inventor in the industry. Her innovative methods for wafer inspection continue to shape the future of semiconductor manufacturing.
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