Hangzhou, China

Shangjian Chen

This inventor holds 10 USPTO granted patents and 4 EPO patents. Top assignees: Scantech (Hangzhou) Co., Ltd., Hangzhou Scantech Co., Ltd, Scantech (Hangzhou) Co, Ltd. Active years: 2019-2026.


% Patents Active = 90.0

 

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2019-2026

Loading Chart...
Loading Chart...
10 patents (USPTO):Explore Patents

Title: Innovations of Shangjian Chen

Introduction

Shangjian Chen is a prominent inventor based in Hangzhou, China. He has made significant contributions to the field of tracking systems and three-dimensional scanning technologies. With a total of 10 patents to his name, Chen continues to push the boundaries of innovation.

Latest Patents

Among his latest patents is a "Tracking method for tracking measurement system, tracking system, and tracking apparatus." This invention provides a method for acquiring the current tracking distance between a tracking apparatus and a to-be-tracked object. It also determines a tracking parameter level based on this distance. Another notable patent is the "Multi-mode three-dimensional scanning method and system." This method involves obtaining intrinsic and extrinsic parameters of a calibrated camera in various scanning modes. It allows for seamless switching between modes while ensuring that the surface point cloud of the scanned object is accurately output.

Career Highlights

Shangjian Chen has worked with notable companies such as Scantech (Hangzhou) Co., Ltd. and Hangzhou Scantech Co., Ltd. His work in these organizations has been instrumental in developing advanced tracking and scanning technologies.

Collaborations

Some of his notable coworkers include Jun Zheng and Jiangfeng Wang. Their collaborative efforts have contributed to the success of various projects and innovations in the field.

Conclusion

Shangjian Chen's innovative work in tracking systems and three-dimensional scanning continues to impact the industry significantly. His patents reflect a commitment to advancing technology and improving measurement systems.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…