The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Apr. 18, 2019
Hangzhou Scantech Company Limited, Hangzhou, CN;
Jun Zheng, Hangzhou, CN;
Shangjian Chen, Hangzhou, CN;
SCANTECH (HANGZHOU) CO., LTD., Hangzhou, CN;
Abstract
A three-dimensional (3D) scanning method is disclosed, including: projecting, by at least two laser projectors in a 3D scanner, laser contour lines onto a surface of a scanned object; capturing, by a first camera in the 3D scanner, a two-dimensional (2D) pattern of the laser contour lines projected onto the surface of the scanned object; identifying, by a processor in the 3D scanner, a 2D line set at a highlight center from the 2D pattern of the laser contour lines; generating, by the processor based on the 2D line set, 3D contour point cloud data of the surface of the scanned object according to triangulation, wherein a position of the first camera is fixed, the at least two laser projectors correspond to at least two different wavelengths, and a spatial position relationship between light planes projected by the at least two laser projectors and the first camera is predetermined.