The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Aug. 18, 2023
Scantech (Hangzhou) Co., Ltd., Hangzhou, CN;
Jiangfeng Wang, Hangzhou, CN;
Shangjian Chen, Hangzhou, CN;
Chuanpeng Jiang, Hangzhou, CN;
Zhe Zhang, Hangzhou, CN;
Jun Zheng, Hangzhou, CN;
SCANTECH (HANGZHOU) CO., LTD., Hangzhou, CN;
Abstract
A three-dimensional scanning system, a scanning path planning method, and a three-dimensional scanning method are provided. The three-dimensional scanning system includes a control apparatus configured to determine a planned scanning path for a to-be-measured object based on a historical scanning path of an object type to which the current to-be-measured object belongs and according to a historical pose and a current pose of a rotary table carrying the to-be-measured object. The three-dimensional scanning system further includes a mechanical arm that includes a gripping end for gripping a scanner to drive the scanner to scan the to-be-measured object according to the planned scanning path under control of the control apparatus.