Hangzhou, China

Jiangfeng Wang

This inventor holds 6 USPTO granted patents. Top assignees: Scantech (Hangzhou) Co., Ltd., Scantech (Hangzhou) Co, Ltd. Active years: 2022-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiangfeng Wang. Retrieved from https://idiyas.com/inventor/jiangfeng-wang-stzqw5fw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 83.3

Average Co-Inventor Count = 4.3

ph-index = 1


Company Filing History:


Years Active: 2022-2026

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6 patents (USPTO):Explore Patents

Title: Jiangfeng Wang: Innovator in Tracking Technologies

Introduction

Jiangfeng Wang is a prominent inventor based in Hangzhou, China. He has made significant contributions to the field of tracking technologies, holding a total of 6 patents. His work focuses on developing advanced methods and systems for tracking measurement.

Latest Patents

Wang's latest patents include a tracking method for a tracking measurement system, which provides a comprehensive approach to acquiring current tracking distances and determining tracking parameter levels. Another notable patent is a multi-mode three-dimensional scanning method and system. This innovative method involves obtaining intrinsic and extrinsic parameters of a calibrated camera in various scanning modes, allowing for seamless transitions and enhanced scanning capabilities.

Career Highlights

Wang is currently employed at Scantech (Hangzhou) Co., Ltd., where he continues to push the boundaries of tracking technology. His expertise in this area has positioned him as a key player in the industry, contributing to advancements that improve measurement accuracy and efficiency.

Collaborations

Wang collaborates with talented individuals such as Jun Zheng and Shangjian Chen, further enhancing the innovative environment at Scantech. Their combined efforts foster a culture of creativity and technical excellence.

Conclusion

Jiangfeng Wang's contributions to tracking technologies exemplify his dedication to innovation. His patents reflect a commitment to advancing measurement systems, making a significant impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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