The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Dec. 17, 2020
Scantech (Hangzhou) Co., Ltd., Hangzhou, CN;
Jun Zheng, Hangzhou, CN;
Shangjian Chen, Hangzhou, CN;
Jiangfeng Wang, Hangzhou, CN;
Lidan Zhang, Hangzhou, CN;
SCANTECH (HANGZHOU) CO., LTD., Hangzhou, CN;
Abstract
A multi-mode three-dimensional scanning method includes: obtaining intrinsic parameters and extrinsic parameters of a calibrated camera in different scanning modes, and upon switching between the different scanning modes, triggering a change of parameters of the camera to the intrinsic parameters and the extrinsic parameters in a corresponding scanning mode; and a user selecting to execute a laser-based scanning mode, a speckle-based scanning mode or a transition scanning mode according to a scanning requirement. In the continual fusion and conversion during the whole scanning process, the speckle reconstruction and the laser line reconstruction are unified to the same coordinate system, and the surface point cloud of the object being scanned is output. The present disclosure also provides a multi-mode three-dimensional scanning system.