The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Sep. 11, 2023
Applicant:

Scantech (Hangzhou) Co., Ltd., Hangzhou, CN;

Inventors:

Jiangfeng Wang, Hangzhou, CN;

Shangjian Chen, Hangzhou, CN;

Bing Ye, Hangzhou, CN;

Zhaolong Wang, Hangzhou, CN;

Jun Zheng, Hangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 17/10 (2006.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 17/10 (2013.01); G06T 2200/04 (2013.01); G06T 2200/08 (2013.01); G06T 2210/56 (2013.01);
Abstract

A three-dimensional scanning system includes a scanning apparatus configured to acquire first raw image data of a scanning target. The three-dimensional scanning system further includes a first field programmable gate array (FPGA) module provided in the scanning apparatus and configured to perform computational preprocessing on the first raw image data to obtain valid first feature data. The three-dimensional scanning system further includes a modeling terminal connected to the scanning apparatus and configured to perform modeling processing based on the first feature data to generate a three-dimensional model of the scanning target.


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