The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Jun. 05, 2018
Hangzhou Scantech Company Limited, Hangzhou, CN;
Jun Zheng, Hangzhou, CN;
Shangjian Chen, Hangzhou, CN;
ScanTech (Hangzhou) Co., Ltd., Hangzhou, CN;
Abstract
A handheld large-scale three-dimensional measurement scanner system simultaneously having photogrammetric and three-dimensional scanning functions includes: two cameras at fixed positions; at least one pattern projector; a photogrammetric module; and a three-dimensional scanning module, wherein at least one of the two cameras is a multipurpose camera that performs photogrammetry and three-dimensional scanning, wherein the photogrammetric module is configured to perform, by operating the multipurpose camera, global photogrammetry on a measured object and obtain three-dimensional coordinates of markers on a surface of the object, and wherein the three-dimensional scanning module is configured to perform, by operating the two cameras and the one pattern projector, three-dimensional scanning on the measured object by using the obtained markers as global positioning information of the measured object, and obtain three-dimensional contour data of the surface of the object. The present invention has photogrammetric and three-dimensional scanning functions simultaneously, a high degree of hardware integration, simplicity in operation, and excellent cost-performance ratio.