Tokyo, Japan

Satoshi Yanobe

This inventor holds 25 USPTO granted patents and 10 published patent applications and 13 EPO patents, primarily in Nondestructive Inspection. Top assignees: Topcon Corporation, Kabushiki Kaisha Topcon, Riken Corporation. Active years: 2016-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satoshi Yanobe. Retrieved from https://idiyas.com/inventor/satoshi-yanobe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25 

% Patents Active = 96.0

 

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 32(Granted Patents)


Location History:

  • Odawara, JP (2020)
  • Tokyo-to, JP (2016 - 2021)
  • Tokyo, JP (2017 - 2024)

Company Filing History:


Years Active: 2016-2025

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Areas of Expertise:
Nondestructive Inspection
Surveying System
Photogrammetry
Machine Learning
Angle Detection
Ultrasonic Motor
Measurement Device
Laser Scanner
Inclination Sensor
Automatic Leveling
Rotary Encoder
Tilt Sensor
25 patents (USPTO):Explore Patents

Title: Inventor Satoshi Yanobe

Introduction: Satoshi Yanobe is a renowned inventor based in Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Satoshi Yanobe holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies.

Career Highlights: With over two decades of experience in the innovation industry, Yanobe has worked with leading research institutions and universities to develop cutting-edge solutions for complex challenges.

Collaborations: Throughout his career, Satoshi Yanobe has collaborated with multinational companies, startups, and fellow inventors to bring his ideas to life and make a positive impact on society.

Conclusion: Satoshi Yanobe's passion for innovation and his dedication to pushing the boundaries of technology continue to inspire the next generation of inventors worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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