The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Oct. 18, 2016
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Masaki Kamiki, Tokyo-to, JP;

Goro Iwasaki, Tokyo-to, JP;

Shinji Yamaguchi, Tokyo-to, JP;

Satoshi Yanobe, Tokyo-to, JP;

Eiji Takeuchi, Tokyo-to, JP;

Yosuke Okudaira, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/20 (2006.01); G01C 9/06 (2006.01);
U.S. Cl.
CPC ...
G01C 9/20 (2013.01); G01C 9/06 (2013.01); G01C 2009/066 (2013.01);
Abstract

The invention provides a tilt angle measuring device, which comprises a discoid container for including a liquid forming a free liquid surface, a light emitting source for allowing a detection light to enter the free liquid surface, a photodetector for receiving the detection light reflected on the free liquid surface and a signal processing unit for detecting a tilt of the free liquid surface based on a detection signal from the photodetector, wherein the signal processing unit sets a detection light storage time of the photodetector so that an error incidence rate of the detection signal is a predetermined value.


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