The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Sep. 25, 2017
Topcon Corporation, Itabashi-ku, Tokyo, JP;
Takahiro Inoue, Tokyo, JP;
Satoshi Yanobe, Tokyo, JP;
Hideyuki Matsumoto, Tokyo, JP;
Fumio Ohtomo, Tokyo, JP;
Topcon Corporation, Itabashi-ku, Tokyo, JP;
Abstract
A measurement device and measurement method are provided which are capable of measuring the inclination of a measurement target object surface both with a simple configuration and at high speed. The measurement device includes: a rangefinding light emitting section; a rangefinding unit configured to receive reflected rangefinding light; an optical axis deflection section provided on an optical path common to rangefinding light and reflected rangefinding light, and configured to deflect optical axes thereof; a motor configured to cause the optical axis deflection section to rotate; an emission direction detection unit configured to detect a deflection angle and deflection direction resulting from the optical axis deflection section; and a computation controller that measures the inclination of a measurement target object surface with respect to the emission optical axis on the basis of acquired coordinate data on the measurement target object surface.