The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2025
Filed:
Mar. 31, 2022
Topcon Corporation, Tokyo, JP;
Riken, Wako, JP;
Shigenori Nagano, Tokyo, JP;
Satoshi Yanobe, Tokyo, JP;
Akira Yajima, Tokyo, JP;
Hanako Aikoh, Tokyo, JP;
Satoru Ishiguro, Tokyo, JP;
Yoshie Otake, Wako, JP;
Yasuo Wakabayashi, Wako, JP;
Masato Takamura, Wako, JP;
TOPCON CORPORATION, Tokyo, JP;
RIKEN, Wako-shi, JP;
Abstract
A non-destructive inspection system includes: a neutron emission unit capable of emitting neutrons having a first neutron dose; a neutron detection unit capable of detecting a second neutron dose of neutrons scattered inside an inspection object A by the emission of the neutrons from the neutron emission unit; a gamma-ray detection unit capable of detecting a gamma dose of gamma rays released from the inspection object A by the emission of the neutrons from the neutron emission unit; and an analysis unit configured to calculate a content of a predetermined substance based on the gamma dose and correct the content of the predetermined substance based on the first neutron dose and the second neutron dose.