The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
May. 24, 2022
Topcon Corporation, Tokyo, JP;
Riken, Wako, JP;
Shigenori Nagano, Tokyo, JP;
Satoshi Yanobe, Tokyo, JP;
Akira Yajima, Tokyo, JP;
Hanako Aikoh, Tokyo, JP;
Satoru Ishiguro, Tokyo, JP;
Yoshie Otake, Wako, JP;
Yasuo Wakabayashi, Wako, JP;
Masato Takamura, Wako, JP;
TOPCON CORPORATION, Tokyo, JP;
RIKEN, Wako, JP;
Abstract
A non-destructive inspection system includes a non-destructive inspection apparatus and a management apparatus. The non-destructive inspection apparatus includes: a neutron emission unit capable of emitting a neutron beam; a gamma-ray detector capable of detecting a gamma ray; an apparatus case covering the neutron emission unit and the gamma-ray detector and including an opening; an outer shutter configured to open and close the opening; dose monitors each provided on the apparatus case and configured to detect a radioactive dose; an apparatus communication unit capable of transmitting apparatus information including the detected radioactive dose to the management apparatus and capable of receiving inspection permission information from the management apparatus; and an apparatus control unit configured to open the outer shutter and allows emission of the neutron beam from the neutron emission unit upon acquisition of the inspection permission information.