The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Sep. 11, 2019
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Satoshi Yanobe, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/26 (2006.01); G01D 5/244 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/266 (2013.01); G01D 5/2448 (2013.01); G01D 5/24495 (2013.01); G01D 18/001 (2021.05);
Abstract

A rotary encoder includes: a rotary disk with an angle code; a light source; a detector reading the angle code; and a processing unit acquiring a reading value. The light source includes at least two light-emitting elements spaced from each other. Every time the rotary disk is rotated by a predetermined angle, where an arbitrary angle from a rotation angle θ within a reading range on the detector is provided as φ, the processing unit acquires reading values f(θ+φ) and f(θ) with a first light-emitting element and a reading value f(θ+φ) with a second light-emitting element, to calculate a reading value error due to deflection at an angle θ+φ based on the difference between the reading values f(θ+φ) and f(θ+φ), to obtain a difference g(θ,φ) between the reading values f(θ+φ) and f(θ) such that the error is reflected, and to self-calibrate based on a change in the difference g(θ,φ).


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