Chennai, India

Sairam Ravu

USPTO Granted Patents = 4 

Average Co-Inventor Count = 6.7

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2019-2023

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4 patents (USPTO):Explore Patents

Title: Sairam Ravu: Innovator in Defect Detection Technologies

Introduction

Sairam Ravu is a notable inventor based in Chennai, India. He has made significant contributions to the field of defect detection technologies, holding a total of 4 patents. His work focuses on utilizing advanced imaging techniques and machine learning to enhance the inspection processes in various industries.

Latest Patents

One of Sairam Ravu's latest patents is titled "System and method for determining defects using physics-based image perturbations." This innovative system is designed to characterize specimens by acquiring images and utilizing a machine learning classifier to identify defects. Another significant patent is "Methods and systems for inspection of semiconductor structures with automatically generated defect features." This patent outlines methods for improved detection and classification of defects based on attributes derived from optical images, employing deep learning models for enhanced accuracy.

Career Highlights

Throughout his career, Sairam has worked with prominent companies such as Kla Tencor Corporation and Kla Corporation. His experience in these organizations has allowed him to develop and refine his expertise in defect detection technologies.

Collaborations

Sairam has collaborated with notable professionals in his field, including Martin Plihal and Saravanan Paramasivam. These collaborations have contributed to the advancement of his research and innovations.

Conclusion

Sairam Ravu's contributions to defect detection technologies through his patents and collaborations highlight his role as an influential inventor in the industry. His work continues to pave the way for advancements in imaging and machine learning applications.

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