Plano, TX, United States of America

Sagar A Kekare

USPTO Granted Patents = 12 

Average Co-Inventor Count = 2.4

ph-index = 5

Forward Citations = 332(Granted Patents)


Location History:

  • Milpitas, CA (US) (2013 - 2019)
  • Plano, TX (US) (2009 - 2022)

Company Filing History:


Years Active: 2009-2022

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12 patents (USPTO):Explore Patents

Title: The Innovative Journey of Sagar A. Kekare

Introduction

Sagar A. Kekare is a notable inventor based in Plano, TX, USA. With an impressive portfolio of 12 patents, he has significantly contributed to the field of semiconductor manufacturing and inspection technologies. His innovative approaches have facilitated advancements in the industry, showcasing his dedication to improving inspection methods.

Latest Patents

One of Sagar's latest patents, titled "Methods and systems for inspection of wafers and reticles using designer intent data," presents multiple computer-implemented methods aimed at enhancing defect detection and analysis during the semiconductor manufacturing process. This innovation emphasizes identifying nuisance defects on wafers based on inspection data from reticles, which are essential in forming patterns on the wafers.

Another computer-implemented method detailed in this patent analyzes inspection data in conjunction with reticle data to identify defects, ensuring that varying portions of the reticle are addressed. Additionally, Sagar's methods facilitate determining properties of manufacturing processes based on defects that may alter characteristics of devices on the wafer. A further aspect of his innovation includes altering or simulating integrated circuit design properties based on inspection data, marking a significant advancement in wafer inspection technology.

Career Highlights

Sagar’s impressive career includes pivotal roles at Kla-Tencor Technologies Corporation and Kla Tencor Corporation. His work at these companies enabled him to refine his skills and apply his innovative ideas to real-world applications in semiconductor technology. His contributions have proven invaluable in developing systems that improve inspection accuracy and efficiency.

Collaborations

Throughout his career, Sagar has collaborated with esteemed professionals, including Ellis Chang and Khurram Zafar. These collaborations have fostered a synergistic environment that has allowed for enhanced innovation and the sharing of ideas within the field of semiconductor inspection.

Conclusion

Sagar A. Kekare stands as a testament to the power of innovation in technology. With his array of patents and unwavering commitment to the semiconductor industry, he continues to inspire future inventors and researchers alike. His work not only addresses current challenges in wafer inspection but also paves the way for future advancements in the field, showcasing the importance of creativity and technical expertise in driving innovation forward.

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