Growing community of inventors

Plano, TX, United States of America

Sagar A Kekare

Average Co-Inventor Count = 2.40

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 332

Sagar A KekareEllis Chang (6 patents)Sagar A KekareAllen Park (3 patents)Sagar A KekareJames Norman Wiley (3 patents)Sagar A KekareCarl Hess (3 patents)Sagar A KekarePeter Rose (3 patents)Sagar A KekareSterling G Watson (3 patents)Sagar A KekareKhurram Zafar (3 patents)Sagar A KekareWilliam Volk (3 patents)Sagar A KekareSharon McCauley (3 patents)Sagar A KekarePaul Frank Marella (3 patents)Sagar A KekareMoshe E Preil (1 patent)Sagar A KekarePrasanti Uppaluri (1 patent)Sagar A KekareIngrid B Peterson (1 patent)Sagar A KekareArdis Liang (1 patent)Sagar A KekareThirupurasundari Jayaraman (1 patent)Sagar A KekareSrikanth Kandukuri (1 patent)Sagar A KekareSergei G Bakarian (1 patent)Sagar A KekareSagar A Kekare (12 patents)Ellis ChangEllis Chang (26 patents)Allen ParkAllen Park (33 patents)James Norman WileyJames Norman Wiley (26 patents)Carl HessCarl Hess (22 patents)Peter RosePeter Rose (13 patents)Sterling G WatsonSterling G Watson (12 patents)Khurram ZafarKhurram Zafar (10 patents)William VolkWilliam Volk (9 patents)Sharon McCauleySharon McCauley (8 patents)Paul Frank MarellaPaul Frank Marella (7 patents)Moshe E PreilMoshe E Preil (28 patents)Prasanti UppaluriPrasanti Uppaluri (12 patents)Ingrid B PetersonIngrid B Peterson (7 patents)Ardis LiangArdis Liang (7 patents)Thirupurasundari JayaramanThirupurasundari Jayaraman (6 patents)Srikanth KandukuriSrikanth Kandukuri (4 patents)Sergei G BakarianSergei G Bakarian (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Kla-tencor Technologies Corporation (7 from 641 patents)

2. Kla Tencor Corporation (4 from 1,787 patents)

3. Synopsys, Inc. (1 from 2,485 patents)


12 patents:

1. 11348222 - Methods and systems for inspection of wafers and reticles using designer intent data

2. 10713771 - Methods and systems for inspection of wafers and reticles using designer intent data

3. 10303839 - Electrically relevant placement of metrology targets using design analysis

4. 10209628 - System and method for defect classification based on electrical design intent

5. 9689923 - Adaptive electrical testing of wafers

6. 9400865 - Extracting comprehensive design guidance for in-line process control tools and methods

7. 9401014 - Methods and systems for utilizing design data in combination with inspection data

8. 9002497 - Methods and systems for inspection of wafers and reticles using designer intent data

9. 8923600 - Methods and systems for utilizing design data in combination with inspection data

10. 8549445 - Targeted production control using multivariate analysis of design marginalities

11. 7769225 - Methods and systems for detecting defects in a reticle design pattern

12. 7570796 - Methods and systems for utilizing design data in combination with inspection data

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as of
12/5/2025
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