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For the Inventor, By the Inventor

Palo Alto, CA, United States of America

Roy E Rand

This inventor holds 25 USPTO granted patents and 1 EPO patent, primarily in Electron Beam Tomography. Top assignees: Imatron, Inc., Ge Medical Systems Global Technology Company, LLC, Imatron Associates. Active years: 1985-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roy E Rand. Retrieved from https://idiyas.com/inventor/roy-e-rand

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25

% Patents Active = 92.0


Average Co-Inventor Count = 1.7

ph-index = 13

Forward Citations = 480(Granted Patents)


Location History:

  • Santa Clara County, CA (US) (1992)
  • Palo Alto, CA (US) (1985 - 2011)

Company Filing History:

goldMedal15 out of 26 
 
Imatron, Inc.
 patents
silverMedal6 out of 1,293 
 
Ge Medical Systems Global Technology Company, LLC
 patents
bronzeMedal2 out of 4 
 
Imatron Associates
 patents
4. 1 out of 30,886 
 
Siemens Aktiengesellschaft
 patents
5. 1 out of 12 
 
Telesecurity Sciences, Inc.
 patents

Years Active: 1985-2011

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Areas of Expertise:
Electron Beam
Tomography
Collimator
Aberration Correction
Oil-Free Source
Scanning System
Focusing System
X-Ray Tube
Ion Control
Magnet Assembly
Beam Monitoring
25 patents (USPTO):Explore Patents
1. 7872241 - Method and apparatus for production and maintenance of electron beam space-charge neutralization (2011-01-18),
2. 7020232 - Electron beam computed tomographic scanner system with helical or tilted target, collimator and detector components to eliminate cone beam error and to scan continuously moving objects (2006-03-28),
3. 6952466 - Oil-free electron source for an EBT scanner (2005-10-04),
4. 6891321 - Oil-free electron source having cathode and anode members adjustable with five degrees of freedom (2005-05-10),
5. 6792077 - Collimation system for dual slice EBT scanner (2004-09-14),
6. 6735271 - Electron beam computed tomographic scanner system with helical or tilted target, collimator, and detector components to eliminate cone beam error and to scan continuously moving objects (2004-05-11),
7. 6670625 - Method and apparatus for correcting multipole aberrations of an electron beam in an EBT scanner (2003-12-30),
8. 6208711 - Method and apparatus for clearing ions in a scanning electron beam computed tomographic system using a single potential power source (2001-03-27),
9. 6160869 - Chicane magnet focusing system and deflection magnet for a scanning (2000-12-12),
10. 5719914 - Method for correcting spherical aberration of the electron beam in a (1998-02-17),
11. 5491734 - Off-axis scanning electron beam computed tomography system (1996-02-13),
12. 5442673 - Fixed septum collimator for electron beam tomography (1995-08-15),
13. 5386445 - Method and apparatus for electron beam focusing adjustment by (1995-01-31),
14. 5289519 - Rotatable ion controlling electrode assembly with no offset or (1994-02-22),
15. 5224137 - Tuning the scanning electron beam computed tomography scanner (1993-06-29),

Title: The Innovative Journey of Roy E Rand

Introduction: Roy E Rand is a distinguished inventor based in Palo Alto, California, known for his groundbreaking contributions to various fields.

Latest Patents: Roy E Rand holds several patents in the areas of technology, healthcare, and consumer products, showcasing his versatility and ingenuity.

Career Highlights: With a career spanning over two decades, Roy E Rand has consistently pushed the boundaries of innovation, leading to the development of cutting-edge solutions that have positively impacted industries worldwide.

Collaborations: Throughout his career, Roy E Rand has collaborated with leading companies, research institutions, and universities, fostering a culture of innovation and knowledge sharing.

Conclusion: Roy E Rand's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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