The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2000

Filed:

Oct. 01, 1998
Applicant:
Inventors:

Geordie Zapalac, San Francisco, CA (US);

Roy E Rand, Palo Alto, CA (US);

Assignee:

Imatron, Inc., So. San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
378138 ; 378-4 ; 378 10 ; 378137 ;
Abstract

Tuning, integrating, and operating an electron beam CT scanning system is simplified by using the fringe field from dipole magnets arranged as a chicane to focus the electron beam, thus replacing conventional quadrupole and solenoid coils. Preferably four 'chicane' dipole magnets are series-coupled with the windings in the downstream deflection magnet, such that the chicane magnet X and Y coils are energized 90.degree. out of phase with the deflection magnet coils. The alternating current polarity in the chicane magnets creates an 'S'-shaped electron beam trajectory that adequately uniformly focuses over the full cross-section of the electron beam. Winding the coils with a cosine distribution permits rotating the magnetic fields to change the azimuthal and deflecting planes of the electron beam, without disturbing the deflection angle and focusing properties. Chicane electrical current directions and magnet positions are such that the electron beam enters and exists the chicane on the axis of the scanning electron beam CT system. A new type of deflecting magnet is provided that has no end windings, and may be used in other beam optical systems.


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