The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 1993

Filed:

May. 23, 1991
Applicant:
Inventors:

Susan E Plomgren, Twinview, CA (US);

John L Couch, San Francisco, CA (US);

Mark C Nicely, San Francisco, CA (US);

Roy E Rand, Palo Alto, CA (US);

Assignee:

Imatron, Inc., So. San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 10 ; 378137 ; 378138 ; 378113 ;
Abstract

A scanning electron beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at one location in the chamber and for directing it to a second location therein, a target located at a third position therein of the type which produces X-rays as a result of the impingement thereon by the electron beam, means for focusing the beam onto the target in the form of a beam spot and for scanning the beam spot across the target along a particular scan path in order to produce X-rays, and means for monitoring the profile, position, and orientation of the beam spot at a plurality of locations along the scan path. The specific scanner disclosed also includes an arrangement for determining from the signals produced by the monitoring devices if the beam spot conforms to as desired profile, position, and orientation and automatically adjusting the electron beam such that its profile, position, and orientation conform to desired values.


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