The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2004
Filed:
Nov. 28, 2000
Roy E. Rand, Palo Alto, CA (US);
Jonathan Harman, Pacifica, CA (US);
Douglas P. Boyd, Hillsborough, CA (US);
GE Medical Systems Global Technology Company LLC, Waukesha, WI (US);
Abstract
A scanning electron beam computed tomographic system eliminates axial offset between target and detector by disposing the target, collimator, and detector such that active portions of the target and detector are always diametrically opposite each other. This result is achieved by providing a helical target, collimator, and detector, or by providing planar target, collimator, and detector components that are inclined relative to the vertical axis such that active portions of the target and detector are always diametrically opposite each other. Either configuration eliminates cone beam error and the necessity to correct for same. Further, the system can provide multi-slice scanning of an object that is in constant motion at a critical velocity, without having to interpolate data. Conventional helical scanning may still be undertaken. Detector elements can be disposed axially to improve signal/noise ratio and to produce a cone beam cancellation effect.