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For the Inventor, By the Inventor

Portland, OR, United States of America

Robert L Gerlach

USPTO Granted Patents = 12


Average Co-Inventor Count = 3.1

ph-index = 9

Forward Citations = 247(Granted Patents)


Location History:

  • Washington County, OR (US) (2002)
  • Portland, OR (US) (1993 - 2006)
  • Eagle Mountain, UT (US) (2012)

Company Filing History:

goldMedal12 out of 799 
 
Fei Comapny
 patents

Years Active: 1993-2012

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12 patents (USPTO):Explore Patents
1. 8164059 - In-chamber electron detector (2012-04-24),
2. 7009187 - Particle detector suitable for detecting ions and electrons (2006-03-07),
3. 6977386 - Angular aperture shaped beam system and method (2005-12-20),
4. 6949756 - Shaped and low density focused ion beams (2005-09-27),
5. 6946654 - Collection of secondary electrons through the objective lens of a scanning electron microscope (2005-09-20),
6. 6900447 - Focused ion beam system with coaxial scanning electron microscope (2005-05-31),
7. 6797969 - Multi-column FIB for nanofabrication applications (2004-09-28),
8. 6797953 - Electron beam system using multiple electron beams (2004-09-28),
9. 6710338 - Focused ion beam system (2004-03-23),
10. 6683320 - Through-the-lens neutralization for charged particle beam system (2004-01-27),
11. 6414307 - Method and apparatus for enhancing yield of secondary ions (2002-07-02),
12. 5241182 - Precision electrostatic lens system and method of manufacture (1993-08-31),

Title: **The Innovations of Robert L. Gerlach: A Pioneer in Particle Detection**

Introduction

Robert L. Gerlach, based in Portland, OR, is an accomplished inventor whose expertise in particle detection has led to a remarkable portfolio of 12 patents. His contributions to the field have enhanced the understanding and capability of charged particle beam systems through innovative designs and applications.

Latest Patents

Among his latest inventions is an **in-chamber electron detector**. This advanced secondary particle detector encompasses a scintillator and a photomultiplier tube strategically positioned within a vacuum chamber. By positioning the photomultiplier inside the chamber, Gerlach's design improves detection efficiency by eliminating optical couplings, while providing greater flexibility for detector positioning. Another notable patent is a **particle detector suitable for detecting ions and electrons**. This innovative device can switch from ion detection to electron detection, thanks to its ion-to-electron converter and scintillator detector. With specific voltage settings, the detector operates efficiently in both modes, making it ideal for focused ion beam applications.

Career Highlights

Gerlach’s career is marked by significant advancements in particle detection technology, with a strong emphasis on developing solutions that push the boundaries of existing methodologies. His commitment to innovation has established him as a key figure in the research community.

Collaborations

Throughout his career, Robert has collaborated with notable coworkers such as Mark Utlaut and Paul P. Tesch. These partnerships have fostered an environment of creativity and technical advancement, facilitating groundbreaking work in the sphere of particle detection.

Conclusion

Robert L. Gerlach’s contributions to the field of particle detection are invaluable, reflected in his extensive patent portfolio and collaborative efforts with esteemed colleagues. His innovative designs continue to influence the way charged particle beam systems are understood and utilized in various scientific and industrial applications.

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