Company Filing History:

9 out of 29,232

Texas Instruments Corporation

Years Active: 1999-2010

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10 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7679383 - Cantilever probe card (2010-03-16),

2. 7026833 - Multiple-chip probe and universal tester contact assemblage (2006-04-11),

3. 6970005 - Multiple-chip probe and universal tester contact assemblage (2005-11-29),

4. 6911834 - Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing (2005-06-28),

5. 6906539 - High density, area array probe card apparatus (2005-06-14),

6. 6752012 - Combined electrical test and mechanical test system for thin film characterization (2004-06-22),

7. 6720780 - High density probe card apparatus and method of manufacture (2004-04-13),

8. 6636063 - Probe card with contact apparatus and method of manufacture (2003-10-21),

9. 6586839 - Approach to structurally reinforcing the mechanical performance of silicon level interconnect layers (2003-07-01),

10. 5981370 - Method for maximizing interconnection integrity and reliability between (1999-11-09),

Title: Reynaldo M Rincon: Innovator in Probe Card Technology

Introduction

Reynaldo M Rincon is a notable inventor based in Richardson, TX (US). He holds 10 patents that showcase his contributions to the field of probe card technology. His innovative designs have significantly impacted the testing of integrated circuits.

Latest Patents

One of his latest patents is the Cantilever Probe Card, which presents a method and apparatus for a flattened probe element wire. This design includes a beam portion and a tip portion, with at least part of the tip being flattened. The flattened probe element wires exhibit greater z-direction height strength, enhancing the maximum vertical force they can withstand. Additionally, these wires show decreased variability in their tips, leading to improved performance. Another significant patent is the Multiple-Chip Probe and Universal Tester Contact Assemblage. This invention features a probe card assemblage that allows for simultaneous testing of multiple integrated circuit chips. It includes an interposer with protruding contact elements that connect with chips on a wafer, ensuring efficient testing.

Career Highlights

Reynaldo has worked with prominent companies such as Texas Instruments Corporation and Sv Probe Pte. Ltd. His experience in these organizations has contributed to his expertise in probe card technology and innovation.

Collaborations

Throughout his career, Reynaldo has collaborated with notable individuals, including Richard W Arnold and Jerry J Broz. These partnerships have fostered advancements in his field and have led to the development of groundbreaking technologies.

Conclusion

Reynaldo M Rincon's contributions to probe card technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the future of integrated circuit testing.

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