The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2005
Filed:
Jan. 25, 2002
Scott W. Mitchell, Plano, TX (US);
Reynaldo M. Rincon, Richardson, TX (US);
Jerry Broz, Longmont, CO (US);
Gerard Laugier, Villeneuve Loubet, FR;
Scott W. Mitchell, Plano, TX (US);
Reynaldo M. Rincon, Richardson, TX (US);
Jerry Broz, Longmont, CO (US);
Gerard Laugier, Villeneuve Loubet, FR;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Apparatus and methods for testing conductive bumps or target test points on integrated circuits. A multiplicity of probes are extended through a support substrate. At least one of the multiplicity of probe locations include a second electrically isolated probe such that the test point is in contact with two probes. One of the two probes provides a voltage to the test point and the second probe sensing the voltage so as to provide a Kelvin connection.