The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Feb. 28, 2007
Lich Thanh Tran, San Jose, CA (US);
Son N. Dang, Tempe, AZ (US);
Gerald W. Back, Gilbert, AZ (US);
Reynaldo M. Rincon, Richardson, TX (US);
Lich Thanh Tran, San Jose, CA (US);
Son N. Dang, Tempe, AZ (US);
Gerald W. Back, Gilbert, AZ (US);
Reynaldo M. Rincon, Richardson, TX (US);
SV Probe Pte. Ltd., Singapore, SG;
Abstract
A method and apparatus for a flattened probe element wire is provided. A probe element wire includes a beam portion and a tip portion. At least a part of the tip portion is flattened. Flattened probe element wires may have greater z-direction height strength, thereby increasing maximum probe element wire z-direction vertical force. Flattened probe element wires may also have decreased variability in the flattened probe element wire tips. A probe card assembly may includes a substrate and a plurality of at least partially flattened probe element wires supported by the substrate. Such probe card assemblies may have an extended life and maintained within design parameters for a longer period of use.