The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Dec. 01, 1997
Applicant:
Inventors:

Reynaldo M Rincon, Richardson, TX (US);

Yee Hsun U, Richardson, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438612 ; 438613 ; 438614 ; 438615 ; 438616 ; 438617 ; 438 14 ; 438 15 ; 438 17 ;
Abstract

A method of fabricating a semiconductor device which includes providing a shaped bond pad, preferably rectangular or oval. A cavity followed by a hill are formed in the bond pad by performing a probe test at one end portion of the bond pad. Then a ball bond is formed on the bond pad remote and spaced from the cavity. The ball bond can extend onto the hill or be spaced from the hill. The bond pad preferably has a greater length than width and the cavity, hill and ball bond are disposed successively along the length of the bond pad. The length of the bond pad in the direction normal to the cavity, the hill and the ball bond is greater than the sum of the diameter of a probe tip with which a probe test will be made on the bond pad and the diameter of the ball bond.


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