This inventor holds 9 USPTO granted patents and 1 EPO patent. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation. Active years: 2004-2018.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Rex Runyon. Retrieved from https://idiyas.com/inventor/rex-runyon
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
EPO Patents = 1
Average Co-Inventor Count = 6.0
ph-index = 4
Forward Citations = 46(Granted Patents)
Location History:
- (2015 - 2017)
- Fremont, CA (US) (2004 - 2018)
Company Filing History:
7 out of 1,787 
Kla Tencor Corporation
2 out of 641 
Kla-Tencor Technologies Corporation
Years Active: 2004-2018
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9 patents (USPTO):Explore Patents
2. 9645093 - System and method for apodization in a semiconductor device inspection system (2017-05-09),
I specialize in themes related to innovations, inventions, inventors, patent attorneys, assignees, and patents.
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Rex Runyon. Retrieved from https://idiyas.com/inventor/rex-runyon
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]