Milpitas, CA, United States of America

Qiang Zhao

This inventor holds 29 USPTO granted patents and 6 published patent applications and 1 EPO patent, primarily in Semiconductor Metrology. Top assignees: Kla Tencor Corporation, Kla Corporation, Tokyo Electron Limited. Active years: 2000-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qiang Zhao. Retrieved from https://idiyas.com/inventor/qiang-zhao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 29 

% Patents Active = 93.1

 

Average Co-Inventor Count = 4.4

ph-index = 6

Forward Citations = 276(Granted Patents)


Location History:

  • San Jose, CA (US) (2000 - 2014)
  • Fremont, CA (US) (2021)
  • Milpitas, CA (US) (2014 - 2024)

Company Filing History:


Years Active: 2000-2026

Loading Chart...
Loading Chart...
Areas of Expertise:
Nanoscale Imaging
Second Harmonic Generation
Spectroscopic Metrology
Process Monitoring
Defect Detection
Thin Film Characterization
Automated Metrology
Electrical Performance Metrics
Anisotropic Dielectric
Semiconductor Structures
High Throughput
Yield Management
29 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Qiang Zhao in the Field of Plasma Processing

Introduction

Qiang Zhao, based in Milpitas, CA, is a distinguished inventor with a remarkable portfolio of 25 patents. His work primarily focuses on advancements in the realm of plasma processing and metrology systems. Zhao's innovative contributions have significantly influenced the semiconductor manufacturing industry, particularly through his latest patented technologies.

Latest Patents

Among his recent patents, the "Normal-incidence in-situ process monitor sensor" stands out as a pivotal development. This apparatus is designed for in-situ etching monitoring within a plasma processing chamber. It features a continuous wave broadband light source, coupled with an illumination system that directs an incident light beam onto the substrate at normal incidence. The technology allows for precise measurement of various properties of the substrate by employing a collection system that analyzes the reflected light beam, ultimately enabling real-time control of the etching process.

Another notable patent is the "Bandgap measurements of patterned film stacks using spectroscopic metrology." This innovative system employs a spectroscopic metrology tool that works in conjunction with a controller. The controller is adept at generating multilayer grating models, interpreting spectroscopic signals, and predicting bandgaps of test layers, thereby enhancing the accuracy of measurements in semiconductor applications.

Career Highlights

Qiang Zhao's career includes significant tenures at reputable companies such as Kla-Tencor Corporation and Tokyo Electron Limited. His work at these organizations has solidified his reputation as a leading figure in the field of plasma processing technologies and metrology.

Collaborations

Throughout his career, Zhao has had the opportunity to collaborate with esteemed colleagues, including Leonid Poslavsky and Ming Di. These partnerships have undoubtedly contributed to the advancement of their collective research and innovations within the industry.

Conclusion

In summary, Qiang Zhao's contributions to the fields of plasma processing and spectroscopic metrology are invaluable. His 25 patents reflect a commitment to innovation and excellence in technology development. As industries continue to evolve, the impact of Zhao's work will undoubtedly resonate within the semiconductor manufacturing sector and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…