Philipp Huethwohl

Title: Innovations by Philipp Huethwohl

Introduction

Philipp Huethwohl is a notable inventor based in Ulm, Germany. He has made significant contributions to the field of microscopy, particularly in the development of advanced imaging techniques. With a total of 2 patents, his work has garnered attention in the scientific community.

Latest Patents

Huethwohl's latest patents include a method of recording an image using a particle microscope. This innovative method involves recording multiple images of an object by scanning several particle beams across it and detecting the signals generated. The process includes determining regions of interest and image distortions based on the recorded data. Another significant patent is for multi-scanning electron microscopy for wafer alignment. This method controls a multi-scanning electron microscope to capture images of a wafer while determining its radial axis and registering the wafer coordinate system with the handling stage.

Career Highlights

Philipp Huethwohl is currently employed at Carl Zeiss SMT GmbH, a company renowned for its precision optics and imaging technologies. His work at this esteemed organization has allowed him to push the boundaries of microscopy and contribute to advancements in the field.

Collaborations

Throughout his career, Huethwohl has collaborated with notable colleagues, including Jens Timo Neumann and Thomas Korb. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Philipp Huethwohl's contributions to microscopy through his patents and work at Carl Zeiss SMT GmbH highlight his role as a leading inventor in the field. His innovative methods continue to influence advancements in imaging technology.