Jena, Germany

Peter Westphal

USPTO Granted Patents = 29 

 

Average Co-Inventor Count = 2.2

ph-index = 6

Forward Citations = 165(Granted Patents)


Company Filing History:


Years Active: 2005-2025

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29 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Peter Westphal in Optical Measurements

Introduction

Peter Westphal, a prominent inventor based in Jena, Germany, has made significant contributions to the field of optical measurements. With an impressive portfolio of 26 patents, his work primarily focuses on innovative methods for analyzing and measuring surface topographies and advancements in ophthalmological examination techniques.

Latest Patents

Among Peter Westphal's latest patents is a groundbreaking "Method and system for measuring a surface topography of an object." This invention details a comprehensive approach that involves providing source radiation, illuminating the object’s surface using multiple spatial radiation modes, and employing digital holography to determine surface topography. The method involves steps such as overlaying reference radiation on back-scattered illumination radiation and detecting the resulting interference signal.

Another notable patent is the "Method for self-examination of an eye and ophthalmological self-examination apparatus." This invention allows patients to perform self-examinations of their eyes using a specialized apparatus that includes front optics. It also entails a mechanism to determine the deviation of the pupil and provides corrective signals to enhance positioning accuracy for the user.

Career Highlights

Peter Westphal has held pivotal roles in esteemed companies such as Carl Zeiss Microscopy GmbH and Carl Zeiss Microimaging GmbH; these experiences have significantly influenced his research and development contributions to optical technologies. His innovations reflect a blend of theoretical knowledge and practical application, pushing boundaries in the fields of microscopy and ophthalmology.

Collaborations

Westphal has collaborated with notable professionals in the industry, including Daniel Bublitz and Reiner Mitzkus. These partnerships have fostered a creative exchange of ideas, enhancing the quality and impact of their collective work in the optical measurement and examination technologies.

Conclusion

Peter Westphal's inventive spirit and valuable patents showcase his profound impact on optical measurement techniques and self-examination technologies. His legacy in this innovative field continues to inspire future developments and advancements, solidifying his reputation as a leading figure in contemporary optical research.

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