The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Jun. 08, 2023
Applicant:

Carl Zeiss Spectroscopy Gmbh, Jena, DE;

Inventors:

Peter Westphal, Jena, DE;

Daniel Bublitz, Rausdorf, DE;

Karsten Lindig, Erfurt, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 2201/127 (2013.01);
Abstract

A measurement device for spectroscopic constituent analysis includes a control unit, a light source, a sample holder arranged in the beam path of the light source, and a spectral measurement module. The measurement module comprises at least one photosensor with organic photodiodes arranged on a substrate and a temperature sensor arranged at the photosensor. During a sample measurement, a method using the measurement device comprises: detecting an actual temperature at the photosensor; pivoting-in a dark reference sample and measuring a dark reference value; pivoting-in a bright reference sample and measuring a bright reference value; measuring a spectral value of the sample and correcting the spectral value by means of a correction calculation by way of the control unit using the dark reference value, the bright reference value, the spectral value of the sample, the temperature and using values which were determined in a pre-calibration and stored in the control unit.


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