The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Dec. 13, 2013
Carl Zeiss Microscopy Gmbh, Jena, DE;
Peter Westphal, Jena, DE;
Reiner Mitzkus, Goettingen, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
An autofocus method for a microscope with an objective which images a sample lying in an object plane, including the steps: projecting a longitudinally extended grating slit which lies in a grating slit plane onto the sample, and imaging the projection of the grating slit onto an autofocus camera; determining an intensity distribution of the grating slit image and from this, deducing a preset for a relative adjustment of sample and object plane; projecting a likewise longitudinally extended comparison slit onto the sample, and imaging the projection of the comparison slit onto the autofocus camera; evaluating the width of the comparison slit image at right angles to the longitudinal extension at at least two sites which are spaced apart along the longitudinal extension, and determining a width variation of the comparison slit image, a gradient of the width variation and a direction of the relative adjustment.