The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Apr. 04, 2009
Stefan Steinborn, Bovenden, DE;
Eugen Wehner, Goettingen, DE;
Reiner Mitzkus, Goettingen, DE;
Gleb Milinovici, Goettingen, DE;
Steffen Leidenbach, Reinhausen, DE;
Peter Westphal, Jena, DE;
Stefan Steinborn, Bovenden, DE;
Eugen Wehner, Goettingen, DE;
Reiner Mitzkus, Goettingen, DE;
Gleb Milinovici, Goettingen, DE;
Steffen Leidenbach, Reinhausen, DE;
Peter Westphal, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A microscope including an imaging optical unit, a sample stage for supporting a sample to be examined, a movement unit, by which the distance between sample stage and imaging optical unit can be altered, a focus measuring unit, which measures the present focus position and outputs a focus measurement signal, a control unit for maintaining a predetermined focus position for examinations of the sample that are separated from one another in time. The control unit receives the focus measurement signal and derives a deviation of the present focus position from the predetermined focus position. Dependent on the deviation derived the movement unit, changes the distance between sample stage and imaging optical unit so that the predetermined focus position is maintained. The control unit drives the movement unit () for maintaining the predetermined focus position only before and/or after at least one of the examinations, but never during the examinations.