The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Nov. 08, 2012
Applicants:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Ag, Oberkochen, DE;
Inventors:
Assignee:
Carl Zeiss AG, Oberkochen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G03H 1/00 (2006.01); G02B 21/36 (2006.01); G02B 21/24 (2006.01); G03H 1/08 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0005 (2013.01); G02B 21/244 (2013.01); G02B 21/245 (2013.01); G02B 21/367 (2013.01); G03H 1/0443 (2013.01); G03H 1/0866 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0883 (2013.01);
Abstract
A method for automatic focusing of a microscope with a microscope objective on a selected area of a specimen, in which a digital hologram of the selected area of the specimen is generated in an off-axis mode and a microscope with which the method is implemented. The digital hologram is used to determine, on the optical axis of the microscope objective, a focus position to be set in which the selected area of the specimen is optimally in focus. Subsequently, a control system is used to set the microscope to the focus position determined and thus is focused on the area selected.