The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Aug. 07, 2013
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Peter Westphal, Jena, DE;
Thomas Engel, Aalen, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A measuring device and corresponding method for measuring a measurement object, comprising an illumination device for illuminating the measurement object with an illumination pattern, a pattern generation device with at least one pattern generating element for bringing about a positionally variant intensity distribution of the illumination pattern, and an optical sensor arrangement for detecting the illumination pattern reflected and/or scattered by the measurement object. The measuring device has an optics which is telecentric at least on the measurement object side and is arranged in a beam path from the illumination device to the measurement object. The optical sensor arrangement detects the illumination pattern through at least one part of the telecentric optics. The pattern generating device is designed in such a way that the illumination pattern has a positionally and/or spectrally variant vertex focal length distribution on the measurement object side.