Company Filing History:
Years Active: 2016-2023
Title: Innovations of Pengli Zhang in Optical Inspection Technology
Introduction
Pengli Zhang is a notable inventor based in Shanghai, China. He has made significant contributions to the field of optical inspection technology, holding three patents that showcase his innovative approach to improving inspection efficiency and accuracy.
Latest Patents
One of his latest patents is an "Automatic Optical Inspection Device and Method." This device is designed to inspect an object under inspection (OUI) carried on a workpiece stage. It includes a plurality of detectors for capturing images of the OUI and multiple light sources for illuminating the OUI in various modes. The synchronization controller manages the activation of the detectors and light sources based on the OUI's position, allowing for efficient inspection with multiple measurement configurations in a single scan.
Another significant patent is the "Chip Defect Detection Device and Detection Method." This apparatus features a light source unit that emits light of at least two wavelengths, a beam splitter for processing the light, and a detection unit that analyzes the interference fringes produced. This technology enhances the accuracy and efficiency of die defect detection, making it suitable for large dies.
Career Highlights
Pengli Zhang has worked with prominent companies such as Shanghai Micro Electronics Equipment (Group) Co., Ltd. and Shanghai Micro Electronics Equipment Co., Ltd. His experience in these organizations has contributed to his expertise in the field of microelectronics and optical inspection.
Collaborations
Throughout his career, Zhang has collaborated with talented individuals, including coworkers Fan Wang and Hailiang Lu. These collaborations have likely fostered an environment of innovation and creativity in his projects.
Conclusion
Pengli Zhang's contributions to optical inspection technology through his patents demonstrate his commitment to advancing the field. His innovative devices and methods have the potential to significantly enhance inspection processes in various applications.
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