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For the Inventor, By the Inventor

Veldhoven, Netherlands

Paul Jacques Van Wijnen

USPTO Granted Patents = 10

Average Co-Inventor Count = 7.3

ph-index = 3

Forward Citations = 60(Granted Patents)


Company Filing History:

goldMedal10 out of 4,896 
 
Asml Netherlands B.v.
 patents

Years Active: 2006-2024

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10 patents (USPTO):Explore Patents
1. 11977034 - Methods and apparatus for measuring a property of a substrate (2024-05-07),
2. 10996176 - Methods and apparatus for measuring a property of a substrate (2021-05-04),
3. 10746668 - Methods and apparatus for measuring a property of a substrate (2020-08-18),
4. 10317191 - Methods and apparatus for measuring a property of a substrate (2019-06-11),
5. 9594029 - Methods and apparatus for measuring a property of a substrate (2017-03-14),
6. 8642235 - Method of optimizing a die size, method of designing a pattern device manufacturing method, and computer program product (2014-02-04),
7. 7679715 - Lithographic processing cell, lithographic apparatus, track and device manufacturing method (2010-03-16),
8. 7679714 - Lithographic apparatus, combination of lithographic apparatus and processing module, and device manufacturing method (2010-03-16),
9. 7403259 - Lithographic processing cell, lithographic apparatus, track and device manufacturing method (2008-07-22),
10. 7112813 - Device inspection method and apparatus using an asymmetric marker (2006-09-26),

Title: Paul Jacques Van Wijnen: Pioneering Innovation in Patents

Introduction:

Paul Jacques Van Wijnen, a visionary inventor based in Veldhoven, NL, has left an indelible mark on the world of patents and inventions. With a total of 10 patents to his name, his relentless pursuit of innovation and commitment to creating a sustainable future shine through in his groundbreaking work.

Latest Patents:

Among his latest patents is the creation of "Methods and Apparatus for Measuring a Property of a Substrate." This innovative method revolutionizes the measurement of properties of wafer substrates, such as Critical Dimension or overlay, by employing a sophisticated sampling plan. This plan includes multiple sub-sampling plans, allowing for precise measurements and control of inspection apparatus to enhance the accuracy of results.

Career Highlights:

Paul Jacques Van Wijnen is an invaluable asset to ASML Netherlands B.V., a leading company in the field of semiconductor equipment manufacturing. His expertise and contributions have propelled the company towards new heights of technological advancement. His dedication to pushing the boundaries of what is possible in the world of patents and inventions is truly commendable.

Collaborations:

In his pursuit of innovation, Paul has collaborated with esteemed colleagues such as Everhardus Cornelis Mos and Wouter Lodewijk Elings. Together, they have worked tirelessly to develop cutting-edge solutions that have the potential to shape the future of the industry.

Conclusion:

Paul Jacques Van Wijnen's passion for innovation and his unwavering commitment to creating a sustainable future through his inventions make him a true visionary in the realm of patents. His work not only inspires the current generation of inventors but also sets a high standard for the next generation to strive towards. As he continues his journey of innovation, the world eagerly awaits the groundbreaking inventions that will undoubtedly emerge from his brilliant mind.

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