Location History:
- München, DE (2007)
- Munich, DE (2002 - 2020)
Company Filing History:
Years Active: 2002-2025
Title: Oliver Nagler: Innovator in Semiconductor Technology
Introduction
Oliver Nagler is a prominent inventor based in Munich, Germany. He has made significant contributions to the field of semiconductor technology, holding a total of 6 patents. His innovative work focuses on systems and methods for detecting and examining cracks in semiconductor substrates.
Latest Patents
One of his latest patents is titled "System and method for the acoustic detection of cracks in a semiconductor substrate." This invention discloses a system that includes a force generating unit, a detector unit with a resonating indenter and an acoustic emission sensor, and an evaluation unit. The system is designed to apply force to the semiconductor substrate and evaluate acoustic signals to determine the presence of cracks. Another notable patent is "System and method for examining semiconductor substrates." This system comprises an indenter that exercises force on the substrate, a piezoelectric acoustic emission sensor to detect emitted acoustic signals, and attaching means to fasten the indenter to the sensor. The resonance frequencies of the indenter and the sensor are attuned to one another, enhancing the detection process.
Career Highlights
Oliver Nagler has worked with leading companies in the industry, including Infineon Technologies AG and Daimler Chrysler AG. His experience in these organizations has allowed him to develop and refine his innovative ideas in semiconductor technology.
Collaborations
He has collaborated with notable coworkers such as Ivan Penjovic and Marianne Unterreitmeier, contributing to advancements in his field.
Conclusion
Oliver Nagler's work in semiconductor technology exemplifies innovation and dedication. His patents reflect a commitment to improving the detection and examination of semiconductor substrates, making significant strides in the industry.