Oksana Kryachek

Title: Oksana Kryachek: Innovator in Test Probe Contactors

Introduction:

Meet Oksana Kryachek, a highly skilled inventor based in San Francisco, CA. With an impressive collection of 18 patents in the field of test probe contactors, Oksana has made significant contributions to the industry. Let's take a closer look at her latest patents, career highlights, and collaborations.

Latest Patents:

One of Oksana's recent patents is titled "Contactor with Angled Depressible Probes in Shifted Bores." This innovative test probe contactor features an angled depressible probe configuration that allows the tips of the compressible probes to "swipe" the contact pads/solder balls of an IC device during contact. This design reduces contact force and facilitates penetration through foreign material layers on the pad/ball surfaces, leading to more precise testing.

Another noteworthy patent is "Integrated Circuit Device Test Tooling with Dual Angle Cavities." In this invention, Oksana devised a test probe assembly designed to ensure reliable electrical contact, particularly grounding, with packaged IC devices. By introducing a small angular differential between the bore axes of the upper block and the main block, Oksana achieved enhanced reliability and grounding performance.

Career Highlights:

Oksana Kryachek has built an exceptional career at Essai, Inc., a prominent technology company specializing in test systems and solutions. Her contributions to the field of test probe contactors have been instrumental in advancing the testing capabilities of integrated circuit devices. With 18 patents to her name, Oksana's expertise and dedication have made a significant impact on the industry.

Collaborations:

Throughout her career, Oksana has had the opportunity to collaborate with talented professionals, including Nasser Barabi and Chee Wah Ho. These collaborations highlight the valuable teamwork and knowledge exchange that drives innovation in the field of test probe contactors. By leveraging the collective expertise of her colleagues, Oksana continues to push the boundaries of technology and contribute to cutting-edge solutions in her field.

Conclusion:

Oksana Kryachek's expertise in test probe contactors is commendable, as evidenced by her impressive collection of 18 patents. Her latest inventions, such as the contactor with angled depressible probes and integrated circuit device test tooling with dual angle cavities, demonstrate her commitment to addressing the challenges of testing IC devices with precision and reliability. Oksana's collaborations with fellow professionals further contribute to her success, making her an invaluable asset in the industry. We look forward to witnessing more breakthroughs from Oksana Kryachek as she continues to innovate and redefine the field of test probe contactors.