The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Feb. 14, 2014
Applicant:
Essai, Inc., Fremont, CA (US);
Inventors:
Nasser Barabi, Lafayette, CA (US);
Chee Wah Ho, Fremont, CA (US);
Joven R. Tienzo, Fremont, CA (US);
Oksana Kryachek, San Francisco, CA (US);
Elena V. Nazarov, San Mateo, CA (US);
Assignee:
Essai, Inc., Fremont, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01R 31/2865 (2013.01); G01R 31/2874 (2013.01);
Abstract
A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT) is configured to preserve the convex shape of the DUT.