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For the Inventor, By the Inventor

San Mateo, CA, United States of America

Elena V Nazarov

This inventor holds 13 USPTO granted patents and 1 published patent application. Top assignee: Essai, Inc.. Active years: 2010-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elena V Nazarov. Retrieved from https://idiyas.com/inventor/elena-v-nazarov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13 

% Patents Active = 100.0

Average Co-Inventor Count = 4.8

ph-index = 4

Forward Citations = 104(Granted Patents)


Company Filing History:

goldMedal13 out of 24 
 
Essai, Inc.
 patents

Years Active: 2010-2021

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13 patents (USPTO):Explore Patents
1. 10908207 - Systems and methods for conforming device testers to integrated circuit device with pressure relief valve (2021-02-02),
2. 10126356 - Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plate (2018-11-13),
3. 9804223 - Systems and methods for conforming test tooling to integrated circuit device with heater socket (2017-10-31),
4. 9557373 - Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structure (2017-01-31),
5. 9494642 - Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanisms (2016-11-15),
6. 9383406 - Systems and methods for conforming device testers to integrated circuit device with pressure relief valve (2016-07-05),
7. 9279852 - Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushings (2016-03-08),
8. 9229049 - Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals (2016-01-05),
9. 9007080 - Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature control (2015-04-14),
10. 8981802 - Systems and methods for conforming device testers to integrated circuit device profiles (2015-03-17),
11. 8653842 - Systems and methods for thermal control of integrated circuits during testing (2014-02-18),
12. 8508245 - Thermal control unit used to maintain the temperature of IC devices under test (2013-08-13),
13. 7663388 - Active thermal control unit for maintaining the set point temperature of a DUT (2010-02-16),

Title: Innovations by Elena V Nazarov

Introduction

Elena V Nazarov is a prominent inventor based in San Mateo, California. She has made significant contributions to the field of integrated circuit device testing, holding a total of 13 patents. Her work focuses on enhancing the efficiency and safety of fluid management systems used in testing environments.

Latest Patents

Among her latest patents is a system and method for conforming device testers to integrated circuit devices with a pressure relief valve. This invention addresses the critical issue of preventing over-pressurization in fluid management systems utilized in integrated circuit device testers. Another notable patent involves systems and methods for conforming test tooling to integrated circuit devices with a whirlwind cold plate. This thermal control unit is designed to maintain a set point temperature on integrated circuit devices under test, ensuring efficient cooling during the testing process.

Career Highlights

Elena has established herself as a key figure in her field through her innovative designs and solutions. Her work at Essai, Inc. has positioned her at the forefront of advancements in integrated circuit testing technology.

Collaborations

Elena collaborates with talented professionals such as Nasser Barabi and Joven R Tienzo, contributing to a dynamic and innovative work environment.

Conclusion

Elena V Nazarov's contributions to integrated circuit device testing through her patents and collaborative efforts highlight her role as a leading inventor in the industry. Her innovations continue to pave the way for advancements in technology and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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