The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Jul. 30, 2012
Nasser Barabi, Lafayette, CA (US);
Chee Wah Ho, Fremont, CA (US);
Joven R. Tienzo, Fremont, CA (US);
Oksana Kryachek, San Francisco, CA (US);
Elena V. Nazarov, San Mateo, CA (US);
Nasser Barabi, Lafayette, CA (US);
Chee Wah Ho, Fremont, CA (US);
Joven R. Tienzo, Fremont, CA (US);
Oksana Kryachek, San Francisco, CA (US);
Elena V. Nazarov, San Mateo, CA (US);
Essai, Inc., Fremont, CA (US);
Abstract
A device tester for an IC device under test (DUT), the DUT having a substrate and an attached die. The device tester includes a thermal control unit and a test socket assembly which conforms to the DUT's profile. The thermal control unit includes a pedestal assembly, a heater having a fuse coupled to a heating element, a substrate pusher, and a force distributor for distributing force between the pedestal assembly and the substrate pusher. The test socket assembly includes a socket insert that supports and also conforms to the DUT's profile.