The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Sep. 18, 2017
Applicant:
Essai, Inc., Fremont, CA (US);
Inventors:
Nasser Barabi, Lafayette, CA (US);
Oksana Kryachek, San Francisco, CA (US);
Chee-Wah Ho, Fremont, CA (US);
Assignee:
ESSAI, INC., Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0483 (2013.01); G01R 1/0466 (2013.01);
Abstract
A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to 'swipe' the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the spring probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force.