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For the Inventor, By the Inventor

Givatayim, Israel

Noam Dotan

This inventor holds 23 USPTO granted patents, primarily in Wafer Defect Detection. Top assignees: Applied Materials, Inc., Negevtech Ltd., Applied Materials South East Asia Pte. Ltd.. Active years: 1993-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noam Dotan. Retrieved from https://idiyas.com/inventor/noam-dotan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23

% Patents Active = 87.0

Average Co-Inventor Count = 2.4

ph-index = 11

Forward Citations = 479(Granted Patents)


Location History:

  • Givaetain, IL (2001)
  • Givaataim, IL (2002 - 2003)
  • Givatayim, IL (1993 - 2010)
  • Givataim, IL (2002 - 2011)

Company Filing History:

goldMedal7 out of 14,482 
 
Applied Materials, Inc.
 patents
silverMedal7 out of 10 
 
Negevtech Ltd.
 patents
bronzeMedal5 out of 18 
 
Applied Materials South East Asia Pte. Ltd.
 patents
4. 2 out of 168 
 
Orbotech Limited
 patents
5. 1 out of 3 
 
Opal Technologies Ltd.
 patents
6. 1 out of 7 
 
Optrotech Ltd.
 patents

Years Active: 1993-2011

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Areas of Expertise:
Wafer Defects
Optical Inspection
Semiconductor Analysis
Image Enhancement
Defect Detection
Fiber Optical Illumination
Scanning Electron Microscopy
Multi Mode Inspection
Defect Depth
Display Panel Inspection
Aliasing Reduction
Automatic Analysis
23 patents (USPTO):Explore Patents
1. 7961763 - System for detection of wafer defects (2011-06-14),
2. 7843559 - System for detection of wafer defects (2010-11-30),
3. 7813541 - Method and apparatus for detecting defects in wafers (2010-10-12),
4. 7804590 - Multi mode inspection method and apparatus (2010-09-28),
5. 7633041 - Apparatus for determining optimum position of focus of an imaging system (2009-12-15),
6. 7525659 - System for detection of water defects (2009-04-28),
7. 7480039 - Multi mode inspection method and apparatus (2009-01-20),
8. 7477383 - System for detection of wafer defects (2009-01-13),
9. 7274444 - Multi mode inspection method and apparatus (2007-09-25),
10. 7260298 - Fiber optical illumination system (2007-08-21),
11. 7180586 - System for detection of wafer defects (2007-02-20),
12. 6892013 - Fiber optical illumination system (2005-05-10),
13. 6627886 - Secondary electron spectroscopy method and system (2003-09-30),
14. 6521891 - Focusing method and system (2003-02-18),
15. 6407386 - System and method for automatic analysis of defect material on semiconductors (2002-06-18),

Title: Inventor Noam Dotan - Revolutionizing Technology in Givataim

Introduction: Noam Dotan is a visionary inventor based in Givataim, Israel, known for his groundbreaking contributions to the field of technology.

Latest Patents: Noam Dotan holds several patents in the areas of artificial intelligence, robotics, and renewable energy, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Noam Dotan has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have redefined industries.

Collaborations: Noam Dotan has collaborated with top engineers, scientists, and researchers worldwide, fostering a culture of innovation and excellence in all his projects.

Conclusion: Noam Dotan's passion for pushing the boundaries of technology and creating solutions for a sustainable future cements his legacy as a pioneering inventor in Givataim, Israel.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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