For the Inventor, By the Inventor

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Singapore, Singapore

Applied Materials South East Asia Pte. Ltd.

USPTO Granted Patents = 18

Forward Citations = 147

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26 inventors (with patents filed for the assignee):

Shai Silberstein (13 out of 15 patents)

Dov Furman (10 out of 23 patents)

Mark Wagner (5 out of 20 patents)

4. Noam Dotan (5 out of 23 patents)

5. Erez Sali (3 out of 25 patents)

6. Gad Neumann (3 out of 15 patents)

7. Ram Segal (3 out of 5 patents)

8. Daniel Mandelik (2 out of 20 patents)

9. Ran Zaslavsky (2 out of 9 patents)

10. Tsafrir Avni (2 out of 2 patents)

11. Oren Cohen (2 out of 3 patents)

12. Ehud Tirosh (1 out of 23 patents)

13. Arnon Gratch (1 out of 3 patents)

14. Tomer Yanir (1 out of 14 patents)

15. Giora Eitan (1 out of 1 patent)

18 patents: Sort by Forward Citations

1. 8135207 - Optical inspection tools featuring parallel post-inspection analysis (2012-03-13),

2. 8098372 - Optical inspection tool featuring multiple speed modes (2012-01-17),

3. 8031931 - Printed fourier filtering in optical inspection tools (2011-10-04),

4. 7973921 - Dynamic illumination in optical inspection systems (2011-07-05),

5. 7961763 - System for detection of wafer defects (2011-06-14),

6. 7924420 - Optical inspection including partial scanning of wafers (2011-04-12),

7. 7916286 - Defect detection through image comparison using relative measures (2011-03-29),

8. 7869643 - Advanced cell-to-cell inspection (2011-01-11),

9. 7843559 - System for detection of wafer defects (2010-11-30),

10. 7843558 - Optical inspection tools featuring light shaping diffusers (2010-11-30),

11. 7826049 - Inspection tools supporting multiple operating states for multiple detector arrangements (2010-11-02),

12. 7813541 - Method and apparatus for detecting defects in wafers (2010-10-12),

13. 7804993 - Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images (2010-09-28),

14. 7804590 - Multi mode inspection method and apparatus (2010-09-28),

15. 7719674 - Image splitting in optical inspection systems (2010-05-18),

Applied Materials is a global leader in materials engineering solutions, with a presence in more than 30 countries. Applied Materials South East Asia Pte. Ltd. operates as a subsidiary in the South East Asia region, offering innovative semiconductor manufacturing equipment, materials, and services. They are committed to driving advancements in technology and enabling transformative capabilities for various industries.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

18 Patents

#127 in Singapore

#128 in Singapore

#33,177 in the World

Singapore, Singapore

Applied Materials South East Asia Pte. Ltd.

Forward Citations = 147

26 inventors:

Shai Silberstein (13 out of 15 patents)

Dov Furman (10 out of 23 patents)

Mark Wagner (5 out of 20 patents)

4. Noam Dotan (5 out of 23 patents)

5. Erez Sali (3 out of 25 patents)

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