Netanya, Israel

Ram Segal


Average Co-Inventor Count = 6.0

ph-index = 4

Forward Citations = 35(Granted Patents)


Company Filing History:


Years Active: 2009-2011

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5 patents (USPTO):

Title: **The Innovative Mind of Ram Segal**

Introduction

Ram Segal, a talented inventor based in Netanya, Israel, has made significant contributions to the field of wafer defect detection. With five patents to his name, Segal has demonstrated a commitment to innovation and excellence in engineering.

Latest Patents

One of Segal’s latest patents focuses on a system for the fast online electro-optical detection of wafer defects. This innovative approach involves illuminating a section of the wafer with a short light pulse from a repetitively pulsed laser. As the wafer moves across the field of view of an imaging system, it is imaged onto a focal plane assembly. This system optically forms a continuous surface of photo-detectors, which plays a crucial role in effective defect detection. The illumination method ensures there is no image smear during wafer motion, thanks to the laser pulse's duration being significantly shorter than the pixel dwell time. Moreover, the pulses are designed with sufficient energy and brightness to adequately illuminate each field of view required for imaging the inspected wafer die. Noteworthy features of this system include a novel fiber optical illumination delivery system that minimizes the effects of source coherence, along with methods for compensating for variations in the pulse energy of a Q-switched laser output, autofocusing methods for the imaging system, and Fourier plane filtering techniques for removing repetitive image features to enhance defect detection.

Career Highlights

Throughout his career, Segal has worked with prominent companies such as Applied Materials South East Asia Pte. Ltd. and Negevtech Ltd. His time with these organizations has allowed him to refine his skills in optics and imaging systems, laying the foundation for his inventive achievements.

Collaborations

Collaboration has been key to Segal’s success. He has worked alongside notable colleagues like Dov Furman and Gad Neumann, contributing to shared projects that push the boundaries of technology in wafer production and inspection systems.

Conclusion

Ram Segal's innovative spirit and dedication to research have made him a notable figure in the field of wafer defect detection. With his five patents, he continues to inspire future inventors and contribute significantly to advancements in technology.

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