For the Inventor, By the Inventor

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Nes Ziona, Israel

Opal Technologies Ltd.

USPTO Granted Patents = 3

Trademarks = 2

Forward Citations = 113

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6 inventors (with patents filed for the assignee):

Arie Shahar (1 out of 79 patents)

Mark Wagner (1 out of 20 patents)

Alexander Goldenstein (1 out of 3 patents)

4. Noam Dotan (1 out of 23 patents)

5. Steven R Rogers (1 out of 2 patents)

6. Alon Litman (1 out of 2 patents)

3 patents: Sort by Forward Citations

1. 5659172 - Reliable defect detection using multiple perspective scanning electron (1997-08-19),

2. 5466940 - Electron detector with high backscattered electron acceptance for (1995-11-14),

3. 5311288 - Method and apparatus for detecting surface deviations from a reference (1994-05-10),

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USPTO Data Jan 1 1976 - Sep 15 2026

3 Patents

#16 in Nes Ziona

#1,777 in Israel

Nes Ziona, Israel

Opal Technologies Ltd.

Forward Citations = 113

6 inventors:

Arie Shahar (1 out of 79 patents)

Mark Wagner (1 out of 20 patents)

Alexander Goldenstein (1 out of 3 patents)

4. Noam Dotan (1 out of 23 patents)

5. Steven R Rogers (1 out of 2 patents)

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