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Orbotech Limited

USPTO Granted Patents = 168

% Expired Patents = 34.5

EPO Patents = 14

Trademarks = 12

Forward Citations = 1,303

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198 inventors (with patents filed for the assignee):

Zvi Kotler (31 out of 38 patents)

Abraham Gross (25 out of 31 patents)

Yigal Katzir (24 out of 33 patents)

4. Michael Zenou (13 out of 70 patents)

5. Eliezer Lipman (11 out of 12 patents)

6. Boris Kling (9 out of 9 patents)

7. Ilia Lutsker (8 out of 10 patents)

8. Zeev Smilansky (8 out of 19 patents)

9. Itay Gur-Arie (8 out of 8 patents)

10. David Fisch (7 out of 7 patents)

11. Yacov Malinovich (7 out of 7 patents)

12. Dan Zemer (7 out of 9 patents)

13. Tal Goichman (7 out of 9 patents)

14. Ofer Saphier (6 out of 80 patents)

15. Arie Glazer (6 out of 6 patents)

Core Competencies:

Defect Detection

Image Classification

3D Printing

Optical Inspection

Laser Metallization

TDI Sensors

Liquid Crystal

Electrical Testing

Micro-Machining

Printing Technologies

Dynamic Beam Shaping

Hologram Reconstruction

168 patents: Sort by Forward Citations

1. 12763654 - Magnetically preloaded stage assembly for electronic components (2026-10-13),

2. 12755370 - Automatic optical inspection using hybrid imaging system (2026-10-06),

3. 12746613 - Repair of solder bumps (2026-09-29),

4. 12721108 - VIOS modulator sensitivity for micro LED backplane array electrical test (2026-08-25),

5. 12716713 - In-situ wafer stress measurement by chromatic confocal sensor scanning with temperature compensation (2026-08-25),

6. 12710265 - IN-SITU WAFER STRESS MEASUREMENT BY CHROMATIC CONFOCAL SENSOR SCANNING WITH VIBRATION COMPENSATION (2026-08-18),

7. 12704791 - Vertical motion axis for imaging optical head (2026-08-11),

8. 12645107 - Paraffinic compound addition to liquid crystals for reduced switching voltage on NCAP-based electro-optical modulator (2026-06-02),

9. 12644851 - Method and apparatus for inspection of panel embedded dies using combined thermal and optical imaging (2026-06-02),

10. 12613515 - System and method for defect mitigation using data analysis (2026-04-28),

11. 12579476 - Adaptive learning for image classification (2026-03-17),

12. 12566208 - Pulsed laser micro LED inspection (2026-03-03),

13. 12563316 - Multi-modality with TDI sensor (2026-02-24),

14. 12561782 - Panel design to improve accurate defect location report (2026-02-24),

15. 12535769 - Systems and methods for reconstruction of digital holograms (2026-01-27),

Company Overview

Orbotech Limited, headquartered in Yavne, Israel, specializes in advanced optical imaging technologies. The company focuses on developing innovative solutions for defect detection and image classification, catering primarily to the electronics manufacturing sector. Its expertise extends to optical inspection, laser metallization, and the integration of TDI sensors and liquid crystal technologies. Orbotech's commitment to enhancing electrical testing processes positions it as a key player in the evolving landscape of high-precision manufacturing and quality assurance.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

168 Patents

#1 in Yavne

#31 in Israel

#4,915 in the World

Orbotech Limited

Forward Citations = 1,303

198 inventors:

Zvi Kotler (31 out of 38 patents)

Abraham Gross (25 out of 31 patents)

Yigal Katzir (24 out of 33 patents)

4. Michael Zenou (13 out of 70 patents)

5. Eliezer Lipman (11 out of 12 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Orbotech Limited. Retrieved from https://idiyas.com/company/orbotech

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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